Learn how Radiant Technologies and Linkam collaborated to improve HFS600E-PB4 stage.
Achieving precise temperature control in semiconductor and electronics research
Characterising the Temperature-induced Evolution of the Shape and Texture of a Silicon Wafer.
Using Raman Spectroscopy to Probe the Degradation of Perovskite Thin Film Photovoltaic Devices
Researchers reveal high temperature stability of exotic silicon phases using Linkam’s THMS600.
Temperature related property characterisation of solar cells using Linkam’s LTS series.
In-situ Investigation of the Crystallization of Molecular Thin Films Under Controlled Humidity
Effect of Temperature on Adhesion of Transparent Thin Film Electrodes on Polymers
Researchers in Lausanne, Switzerland, used Linkam’s mechanical testing system to study the effect of temperature on the adhesion of transparent thin film electrodes on polymers.